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LinkedIn: Alain Bravaix | LinkedIn
Voir le profil complet de Alain C’est gratuit School (ISEN-Toulon) and managing research activities in Reliability of advanced Microelectronics Circuits My research interests are device and circuit reliability developing electrical characterization techniques for novel and ...
学术圈 – V. Huard
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C. R. Parthasarathy , Alain Bravaix , C. Guerin , M. Denais , V. Huard. Practical and accurate Design-in Reliability methodology has been developed for designs ...
Business Profiles
Researchgate: Alain Bravaix
Brest, NPDC, France
Bravaix, Alain
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Private Homepages
contactout.com › Alain-Bravaix Alain Bravaix - ContactOut
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Alain Bravaix's Email and Phone. Manag. Micro- and nano-electronic Dept. @ ISEN-IM2NP. Alain Bravaix's Email. . View Alain's Contact Info.
La société STMicroelectronics et l’Institut Matériaux...
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Alain Bravaix, Enseignant-Chercheur, ISEN Tél : Portable : Contacts Industriels Philippe Roche, ST Fellow ...
STMicroelectronics and the French Institute of Materials,...
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Alain Bravaix, Lecturer-Researcher, ISEN engineering school. Tel: +33 (0) Mobile: +33 (0)
Education
Alain BRAVAIX, 61 ans (LA GARDE, TOULON) - Copains d'avant
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BRAVAIX Alain : Alain BRAVAIX, né en et habite LA GARDE. Aux dernières nouvelles il était à Isen-toulon à TOULON et il y est toujours. Il a étudié à...
Books & Literature
Hot Carrier Degradation in Semiconductor Devices - Google Books
books.google.co.uk
... in Decananometer CMOS Nodes: From an Energy-Driven to a Unified Current Degradation Modeling by a Multiple-Carrier Degradation Process Alain Bravaix, ...
Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9 - Google...
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This issue of ECS Transactions contains the proceedings of a May symposium which brought together contributors in deposition, characterization, and...
Logic Non-volatile Memory: The Nvm Solutions For Ememory - Hsu...
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Alain Bravaix, Didier Goguenheim, Nathalie Revil, and Emanuel Vincent, “Comparison of low leakage and high speed deep submicron PMOSFETs submitted to ...
books.google.co.uk › booksIntegrated Circuit and System Design. Power and Timing ...
books.google.co.uk
Toulon, France 3 Philips R&D Crolles, 850, rue Jean Monnet, Crolles, France .com Abstract.
Related Documents
Microelectronics Reliability - researchr journal
researchr.org
Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix.
Etude, applications et améliorations de la Université Bordeaux I
ori-oai.u-bordeaux1.fr
BAFFLEUR et Alain BRAVAIX d'avoir accepté d'être les rapporteurs de cette ...
Reliability aspects of gate oxide under ESD pulse stress - researchr...
researchr.org
... Kiran V. Chatty, Robert Gauthier, Alain Bravaix. Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability, 49(12): ,
Scientific Publications
DBLP -
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Cloud Mining - DBLP DBLP. Searching for: Alain Bravaix. Oops we found no results for your query. Try to type some keywords or refine by the facets on your ...
DBLP - Harald Gossner
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Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix : Reliability aspects of gate oxide under ESD pulse stress.
Publications
Hot-Carrier Degradation in Decananometer CMOS Nodes: From an...
link.springer.com
Alain Bravaix, Vincent Huard, Florian Cacho, Xavier Federspiel, and David Roy Abstract As the operating temperature increases, the tradeoff between
Hot Carrier Degradation in Semiconductor Devices | SpringerLink
link.springer.com
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability...
theses.fr – Florian Moliere , Fiabilité des technologies CMOS...
www.theses.fr
Depuis ces dernières années, les composants fortement submicroniques du commerce sont utilisés dans les équipements aéronautiques pour des applications...
Miscellaneous
Alain Bravaix | LinkedIn
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View Alain Bravaix's professional profile on LinkedIn. LinkedIn is the world's largest business network, helping professionals like Alain Bravaix discover inside
STMicroelectronics and the French Institute
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Jul 08, · From Yahoo Finance: STMicroelectronics and the French Institute of Materials, ... Alain Bravaix, Lecturer-Researcher, ISEN engineering school Tel:
Alain Bravaix (born December 20, 1960) | World...
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Alain Bravaix, French research scientist. Achievements include patents for On The Fly technique. Member of Institute of Electrical and Electronics Engineers.
STMicroelectronics and the French Institute of Materials ...
finance.yahoo.com
Alain Bravaix, Lecturer-Researcher, ISEN engineering school Tel: +33 (0) Yahoo Finance. GoPro's stock is getting destroyed, here's why. Yahoo Finance.
Alain Bravaix - Marly-le-Roi
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Alain Bravaix est inscrit(e) sur Trombi et a enregistré une adresse e-mail. Consultez ici le profil de Alain Bravaix.
Alain bravaix | Meaning Pronunciation Origin of Baby Name Alain...
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Alain bravaix : Baby Name Alain bravaix Meaning,Pronunciation,Origin,Religion,Pronounce of Baby Name Alain bravaix. Similar Names ,All about the name Alain...
Alain Bravaix - Profile - SAE International
profiles.sae.org
Up to now, the reliability achieved by COTS components was largely sufficient for avionics, in terms of failure rate as well as time to failure.
Alain Bravaix | ISEN - Academia.edu
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4.7 How Resilient Are Emerging Technologies? | DATE 2015
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Marine Saliva 1, Florian Cacho 1, Vincent Huard 1, Xavier Federspiel 1, Damien Angot 1, Ahmed Benhassain 1, Alain Bravaix 2 and Lorena Anghel 3 1 STMicroelectronics ...
DATE 2015
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Alain Bravaix, IM2NP-ISEN, France; Lorena Anghel, TIMA, France. Best Paper Award Nominations. D track ASYMMETRIC UNDERLAPPED FINFET BASED ROBUST SRAM …
Catalogue SUDOC
www.sudoc.abes.fr
Ressource électronique] / Florian Moliere ; sous la direction de Alain Bravaix et ...
A New Policy for COTS Selection: Overcome the DSM Reliability...
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Alain Bravaix · Bruno Louis Foucher · Philippe Perdu. Affiliated:.
Session Matrix : Avionics - COTS and Obsolescence Management
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This session covers the application of COTS electronic components and boards, ... Alain Bravaix, ISEN-Toulon; Bruno Louis Foucher, EADS IW; Philippe Perdu, CNES:
COMMUNIQUE DE PRESSE. Marseille, Crolles, le 9 juillet PDF Free...
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4 AMU Aude Castille-Bonnefoy Tél : ISEN Alain Bravaix Tél : Portable : À propos de STMicroelectronics ST est un leader mondial sur le marché ...
Discussion Groups
www.thierry-lequeu.fr
Hot Carriers: Alain Bravaix, ISEM. Hot-Carrier (HC) degradation has been one of the limiting factors for performance increases in MOSFET's for digital and ...
Program
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Alain Bravaix, Florian Cacho, Xavier Federspiel, Cheikh Ndiaye, Souhir Mhira and Vincent Huard. Potentiality of Healing Techniques in Hot-Carrier Damaged 28nm …
Reliability aspects of gate oxide under ESD pulse stress
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Philipp Riess, David Alvarez, Kiran Chatty, Robert Gauthier, Alain Bravaix.
Madame Wafa ARFAOUI / docteur | Collège doctoral
college-doctoral.univ-amu.fr
Sujet : Fiabilité Porteurs Chauds (HCI) des transistors FDSOI 28nm High-K grille métal. Directeur de thèse : Alain BRAVAIX Co-directeur : Daniela MUNTEANU
Faculty and staff
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école d'ingénieur généraliste formant en 3 ou 5 ans des ingénieurs en informatique et électronique à Lille Brest Toulon.
Off state incorporation into the 3 energy mode device lifetime...
www.semanticscholar.org
Off state incorporation into the 3 energy mode device lifetime modeling for advanced 40nm CMOS node. Alain Bravaix, C Guérin, +6 authors E. Vincent ...
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