Yoichi Ose - Patents
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Yoichi Ose patents. Recent bibliographic sampling of Yoichi Ose patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title): ...
Official Gazette of the United States Patent and Trademark Office: ...
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MAA has 5,608,218 SCANNING ELECTRON MICROSCOPE Mitsugu Sato , Katsuta ; Yoichi Ose , Mito ; Satoru Fukuhara , Katsuta ; Hideo Todokoro , Tokyo , and ...
Official Gazette of the United States Patent and Trademark ...books.google.de › books
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6,121,610 ION TRAP MASS SPECTROMETER KJyomi Yoshinari, Hitachi; Yoichi Ose, and Yoshiaki Kalo, both of Mito, all of Japan, assignors to Hitachi, Ltd., ...
Image compensation device for a scanning electron microscope -...
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Feb 04, · U.S. Patent No. 6,043,491 issued March 28, to Yoichi Ose et al., uses external shielding for clearer SEM images by suppressing interference's.
All web results to the name "Yoichi Ose"
Electron beam apparatus and method for production of its specimen ...www.google.com.na › patents
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Application filed by Tsuyoshi Inanobe, Sho Takami, Yoichi Ose, Katsuhiro Sasada Publication of US A Application granted.
Image compensation device for a scanning electron microscopewww.google.dj › patents
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28, to Yoichi Ose et al., uses external shielding for clearer SEM images by suppressing interferences. U.S. Pat. No. 5,591,971 issued Jan.
Methods and systems for determining overlay and flatness of a ...www.google.com › patents
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US A1 * Yoichi Ose Monochromator and scanning electron microscope using the same. US A1 *
CHARGED PARTICLE BEAM APPARATUS AND Trademark Elitewww.trademarkelite.com › patent › patent-detail
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... HITACHINAKA , JAPAN Hideo Todokoro , HINODE , JAPAN Yoichi Ose , MITO , JAPAN Makoto Ezumi , MITO , JAPAN Noriaki Arai , HITACHINAKA-SHI , JAPAN Takashi ...
[특허]Scanning electron microscope - 한국과학기술정보연구원scienceon.kisti.re.kr › srch › selectPORSrchPatent
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Tetsuya Sawahata JP; Mitsugu Sato JP; Yoichi Ose JP. Scanning electron microscope. USP Todokoro, Hideo; Ezumi, Makoto; Ose, Yoichi; Suzuki, ...
EP A2 - Scanning electron microscope Google Patents
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... Yoichi Ose, Satoru Fukuhara, Hideo Todokoro, Makoto Ezumi: Candidato: Hitachi, Ltd. Esporta citazione: BiBTeX, EndNote, RefMan: Citazioni di brevetti (5), Con ...
DE D scanning Electron Microscope - Google Patents
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Mitsugu Sato, Yoichi Ose, Satoru Fukuhara, Hideo Todokoro, Makoto Ezumi: Applicant: Hitachi Ltd: Export Citation: BiBTeX, EndNote, RefMan: Classifications (9), Legal ...
US B1 - Scanning electron microscope Google Patents
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A scanning electron microscope which obtains a two-dimensional scan image of a sample includes an electron source and a scan deflector for scanning a...
Yoichi Ose, Mito JP - Patent applications
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electrification measurement method and charged particle beam apparatus - The
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Inventors list Os-Ou - Patent application
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Yoichi Ose, JP, Tokyo, ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR, 8. Yoichi Ose, JP, Mito,
Ose, JP - Patent applications
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Patent applications by Yoichi Ose, Mito JP. Yoichi Ose, Tokyo JP. Patent application number, Description, Published , DEVICE FOR ...
US A - Scanning electron microscope Google Patents
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A scanning electron microscope in the present invention, by employing a retarding method and suppressing interferences between an electron beam and...
EP B1 - Charged particle beam device Google Patents
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Inventors, Hideo Todokoro, Makoto Ezumi, Yoichi Ose, Naomasa Suzuki. Applicant, Hitachi Ltd. Export Citation, BiBTeX, EndNote, RefMan.
US B2 - Ion source and ion beam device using same ...www.google.com.tj › patents
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Inventor: Hiroyasu Shichi: Shinichi Matsubara: Yoichi Ose: Yoshimi Kawanami: Noriaki Arai; Current Assignee. The listed assignees may be inaccurate.
US A - Ion trap mass spectrometer Google Patents
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US A, US A, US-A , US A, US A. Inventors, Kiyomi Yoshinari, Yoichi Ose, Yoshiaki Kato.
EP A1 - Charged particle beam device Google Patents
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... EP-A , EP , EP , EP A1, EP A1. Inventores, Makoto Ezumi, Yoichi Ose, Naomasa Suzuki, Hideo Todokoro.
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