Official Gazette of the United States Patent and Trademark Office: ...
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MAA has 5,608,218 SCANNING ELECTRON MICROSCOPE Mitsugu Sato , Katsuta ; Yoichi Ose , Mito ; Satoru Fukuhara , Katsuta ; Hideo Todokoro , Tokyo , and ...
Advances in Imaging and Electron Physics - Google Books
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... Yoshinori Tokura, Masakazu Ichikawa, Eiichi Maruyama, Kazunobu Tanaka, Shigeo Kubota, Yoichi Ose, Katsushige Tsuno, Yasutaka Nishida, Yuzuru Hosoe, ...
1S-A1-1Development of an Easy-to-use Cryo-electron Microscope ...academic.oup.com › jmicro › article-abstract › suppl_1
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1S-A1-1. Development of an Easy-to-use Cryo-electron Microscope for Simultaneous Observation of SEM and Transmission Images. Yoichi Ose,. Yoichi Ose.
Image compensation device for a scanning electron microscope -...
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Feb 04, · U.S. Patent No. 6,043,491 issued March 28, to Yoichi Ose et al., uses external shielding for clearer SEM images by suppressing interference's.
KENBIKYO Vol.52, No.1microscopy.or.jp › jsm › wp-content › uploads › publication › kenbikyo
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On the Design of Electron Lenses 2. Yoichi Ose and Akira Yonezawa. Abstract: A survey on electron lens designing methods is presented in two consecutive ...
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Electron beam apparatus and method for production of its specimen ...www.google.com.na › patents
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Application filed by Tsuyoshi Inanobe, Sho Takami, Yoichi Ose, Katsuhiro Sasada Publication of US A Application granted.
Image compensation device for a scanning electron microscopewww.google.dj › patents
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28, to Yoichi Ose et al., uses external shielding for clearer SEM images by suppressing interferences. U.S. Pat. No. 5,591,971 issued Jan.
Methods and systems for determining overlay and flatness of a ...www.google.com › patents
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US A1 * Yoichi Ose Monochromator and scanning electron microscope using the same. US A1 *
1S-A1-2Innovate Electron Beam by GaN Semiconductor AMinerwww.aminer.cn › pub › s-a-innovate-electron-beam-by-gan-semiconductor...
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icroscope. for Simultaneous Observation of SEM and. Transmission I. mages. Yoichi Ose. 1. ,. Takeshi Sunaoshi. 1. , Yusuke Ta. m. ba. 1. , Yasuhira.
Development of critical dimension measurement scanning electron ...www.spiedigitallibrary.org › full
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by M Ezumi · · Cited by 15 — Makoto Ezumi, Tadashi Otaka, Hiroyoshi Mori, Hideo Todokoro, and Yoichi Ose "Development of critical dimension measurement scanning electron microscope for ...
LO-Phonon Emission Rate of Hot Electrons from an On-Demand ...www.researcher-app.com › paper
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Hideo Morishita, Takashi Ohshima, Kazuo Otsuga, Makoto Kuwahara, Toshihide Agemura, Yoichi Ose. Unbookmark paper Bookmark paper.
[특허]Scanning electron microscope - 한국과학기술정보연구원scienceon.kisti.re.kr › srch › selectPORSrchPatent
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Tetsuya Sawahata JP; Mitsugu Sato JP; Yoichi Ose JP. Scanning electron microscope. USP Todokoro, Hideo; Ezumi, Makoto; Ose, Yoichi; Suzuki, ...
EP A2 - Scanning electron microscope Google Patents
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... Yoichi Ose, Satoru Fukuhara, Hideo Todokoro, Makoto Ezumi: Candidato: Hitachi, Ltd. Esporta citazione: BiBTeX, EndNote, RefMan: Citazioni di brevetti (5), Con ...
DE D scanning Electron Microscope - Google Patents
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Mitsugu Sato, Yoichi Ose, Satoru Fukuhara, Hideo Todokoro, Makoto Ezumi: Applicant: Hitachi Ltd: Export Citation: BiBTeX, EndNote, RefMan: Classifications (9), Legal ...
US B1 - Scanning electron microscope Google Patents
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A scanning electron microscope which obtains a two-dimensional scan image of a sample includes an electron source and a scan deflector for scanning a...
Development of critical dimension measurement scanning ...www.spiedigitallibrary.org › full
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Makoto Ezumi, Tadashi Otaka, Hiroyoshi Mori, Hideo Todokoro, and Yoichi Ose "Development of critical dimension measurement scanning electron microscope ...
Inventors list Os-Ou - Patent application
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Yoichi Ose, JP, Tokyo, ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR, 8. Yoichi Ose, JP, Mito,
US B2 - Electron/ion gun for electron or ion beams with high...
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The invention relates to an electron/ion gun for electron or ion beams, including a beam source and a monochromator. According to the invention, the...
US B2 - Scanning electron microscope having a monochromator...
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A scanning electron microscope having a monochromator that can automatically adjust an electron beam entering the monochromator and operating conditions...
US B2 - Monochromator and scanning electron microscope using...
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An invention providing a scanning electron microscope composed of a monochromator capable of high resolution, monochromatizing the energy and reducing...
WO A1 - Microscope electronique a balayage Google...
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La présente invention concerne un microscope électronique à balayage mettant en oeuvre une technique de formation de champ retardant, et conservant...
US A1 - Electron beam apparatus and method for production...
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A structure of an electron beam apparatus having shielding properties for shielding against an environmental magnetic field is provided. The electron...
US A - Scanning electron microscope Google Patents
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A scanning electron microscope in the present invention, by employing a retarding method and suppressing interferences between an electron beam and...
US A1 - Electron/ion gun for electron or ion beams with...
patents.google.com
The invention relates to an electron/ion gun for electron or ion beams, comprising a beam source and a monochromator. According to the invention, said...
US A1 - Image compensation device for a scanning electron...
patents.google.com
An apparatus for preventing distortion to critical dimension line images formed by a SEM under the influence of external electromagnetic emissions...
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