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WoDiM Conference Papers | AVS Technical Library
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Impact of low thermal processes on reliability of high-k/metal gate stacks. Presentation: Artemisia Tsiara, Xavier Garros, Cao-Minh Vincent Lu, Claire Fenouillet-Beranger, and Gerard Ghibaudo, 4 slides · Convert?cache=true&fit= crop&format=jpeg&h=50&quality=100&w=
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Module 2: Oxides Reliability by Xavier Garros Theory of oxides degradation mechanisms– Experimental applications on CMOS. Module 3: Noise by Jean ...
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SPAD VII 180 HP skins pack - N different planes - posted in SPAD 7.C1 180HP: http://www.mediafire s1d1o75m18wgHop! Forgot something very...
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