Vineeth Govind and Raimund Ubar - Free people check

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Debug Automation from Pre-Silicon to Post-Silicon - Mehdi Dehbashi,...

books.google.de

[RGU09] Jaan Raik, Vineeth Govind, and Raimund Ubar. Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips.

Raimund Ubar - researchr alias

researchr.org

Fault Diagnosis in Integrated Circuits with BIST. dsdm 2007: [doi] · Jaan Raik, Raimund Ubar, Vineeth Govind. Test Configurations for Diagnosing ...

ATS 20th Anniversary Compendium - UMass Amherst

www.ecs.umass.edu

... Vineeth Govind, and Raimund Ubar An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application …

CiteSeerX — An External Diagnosis method for Network-on-a-Chip

citeseerx.ist.psu.edu

@MISC{Raik_anexternal, author = {Jaan Raik and Vineeth Govind and Raimund Ubar}, title = {An External Diagnosis method for Network-on-a-Chip}, year = {}} 20 et al ...

Asian Test Symposium 2011

www.ieee-ats.org

Jaan Raik, Vineeth Govind, and Raimund Ubar. An Efficient Test Pattern Selection Method for Improving Defect Coverage with. Reduced Test Data Volume and ...

12th IEEE European Test Symposium

ets07.informatik.uni-freiburg.de

Jaan RAIK · Raimund UBAR · Vineeth GOVIND : Tallinn University of Technology, Estonia. Optimization of NoC Wrapper Design Under Bandwidth and Test Time Constraints

Test Configurations for Diagnosing Faulty Links in NoC Switches - CORE

core.ac.uk

By Jaan Raik, Raimund Ubar and Vineeth Govind. Abstract. The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs.

All web results to the name "Vineeth Govind"

12th IEEE European Test Symposium

www.ieee-ets.org

Jaan RAIK · Raimund UBAR · Vineeth GOVIND : Tallinn University of Technology, Estonia. Optimization of NoC Wrapper Design Under Bandwidth and Test ...

ERIS - Eesti teadus- ja arendustegevuse infosüsteem

www.eris.ee

Vineeth Govind, MSc, 2004, juh. Jaan Raik, Raimund Ubar, Hannu Tenhunen. RT-level test point insertion for improving testability in sequential ...

Eesti artiklite andmebaas ISE

artiklid.elnet.ee

Autor, Govind, Vineeth. Pealkiri, DFT for application of external test patterns in a network-on-a-chip / Vineeth Govind, Jaan Raik, Raimund Ubar. Väljaanne, Info- ...

ERIS - Eesti teadus- ja arendustegevuse infosüsteem

www.eris.ee

Vineeth Govind, MSc, 2004, juh. Raimund Ubar, Jaan Raik. RTL Test Point Insertion for Improving Testability in Sequential Circuits. TTÜ. Vladisl. ...

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Vineeth Govind and Raimund Ubar Free People Check