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patentbuddy: Tae-Hyung Ihn

SAMSUNG ELECTRONICS CO., LTD., Seoul, KR, US

patentbuddy: Tae Hyung Ihn

HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., Seoul, KR, US

Scientific Publications

Microelectronics Reliability | Vol 39, Issue 1, Pages (January...

www.sciencedirect.com

crystallization. Original Research Article; Pages ; Tae-Hyung Ihn, Tae- Kyung Kim, ...

Publications

Soi Materials | SpringerLink

link.springer.com

Researchers have spent over 20 years developing reliable techniques to produce SOI wafers. The challenge of fabricating SOI material is to produce a thin film...

Miscellaneous

Tae-Hyung Ihn's research works | Seoul National University ...

www.researchgate.net

Tae-Hyung Ihn's 10 research works with 204 citations and 88 reads, including: Effects of the Substrate Pretreatments on the Leakage Current in the Low-Temperature Poly-Si TFTs

Device Characteristics of a Poly-Silicon Thin Film Transistor...

www.cambridge.org

Device Characteristics of a Poly-Silicon Thin Film Transistor Fabricated by Milc at Low Temperature - Volume 424

Effects of the Substrate Pretreatments on the Leakage Current in the...

www.cambridge.org

Effects of the Substrate Pretreatments on the Leakage Current in the Low-Temperature Poly-Si TFTs - Volume 448

Elsevier Science, "Microelectronics Reliability", Volume 39, Issue 1,...

www.thierry-lequeu.fr

Titre : Elsevier Science, Microelectronics Reliability, Volume 39, Issue 1, Pages , January Tae-Hyung Ihn, Tae-Kyung Kim, Byung-Il Lee and Seung Ki Joo

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