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Tadashi Otaka - Patents
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Tadashi Otaka patents Recent bibliographic sampling of Tadashi Otaka patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title):
Forming A Sample Image And Charged Particle Beam Apparatus
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In order to attain the above object, the present invention provide a method of forming a sample image by scanning a charged particle beam on a sample and...
Monochromator And Scanning Electron Microscope Using The Same
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An invention providing a scanning electron microscope composed of a monochromator capable of high resolution, monochromatizing the energy and reducing...
Business Profiles
patentbuddy: Tadashi Otaka
HITACHI, LTD., Hitachinaka, JP
Books & Literature
So Sad to Fall in Battle: An Account of War - Kumiko Kakehashi -...
books.google.de
The Battle of Iwo Jima has been memorialized innumerable times as the subject of countless books and motion pictures, most recently Clint Eastwood’s films...
Publications
Zero-shrink dimension evaluated for ArF-resist patterns measured by...
spie.org
Proceedings Paper Zero-shrink dimension evaluated for ArF-resist patterns measured by CD-SEM. Author(s): Hiroki Kawada; Takashi Iizumi ... Tadashi Otaka, ...
Miscellaneous
EP A2 - Charged-particle beam apparatus Google...
patents.google.com
Tadashi Otaka: Candidato: Hitachi, Ltd. Esporta citazione: BiBTeX, EndNote, RefMan: Citazioni di brevetti (6), Con riferimenti in (1), Classificazioni (4), Eventi
EP A2 - Charged particle beam alignment method and charged...
patents.google.com
An object of the present invention is to provide a charged particle beam apparatus and an alignment method of the charged particle beam apparatus, which...
DE T2 - Ladungsträgerstrahlgerät Google Patents
patents.google.com
Inventeurs, Hironobu Matsui, Mikio Ichihashi, Shinjiroo Ueda, Tadashi Otaka, Kazue Takahashi. Déposant, Hitachi Ltd. Exporter la citation, BiBTeX, EndNote, ...
Otaka, JP - Patent applications
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Patent application number, Description, Published , Heater - A heater has a smooth heating surface and a recess formed on a second surface ...
HITACHI REVIEW -- April Vol.44-No.2
www.hitachi.com
HITACHI REVIEW Volume 44 Number 2 April Featured Articles ... Tadashi Otaka, Hiroyoshi Mori, Osamu Yamada, and Hideo Todokoro © Hitachi, Ltd ,
High-energy scanning electron microscope for the observation of...
www.spiedigitallibrary.org
SPIE Digital Library Journals
DE T2 - Ladungsteilchenstrahl-Gerät, Ionenpumpe und Verfahren...
patents.google.com
Inventeurs, Tadashi Otaka, Mikio Ichihashi. Déposant, Hitachi Ltd. Exporter la citation, BiBTeX, EndNote, RefMan. Référencé par (3), Classifications (8).
EP A3 - Electron beam apparatus Google Patents
patents.google.com
An observation method of an electron beam apparatus for obtaining
a scanning image of a desired region by detecting
electron generated from said desired...
US A - Electron beam apparatus Google Patents
patents.google.com
An electron beam apparatus focusses an electron beam onto a specimen by means of an objective magnetic lens. In order to detect changes in the height of...
Observation of subsurface structures using high-energy SEM
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SPIE Digital Library Proceedings
US A - Charged-particle beam apparatus Google Patents
patents.google.com
The charged-particle beam apparatus according to this invention is of the type in which a specimen is inserted between the upper and lower magnetic poles...
EP B1 - Scanning electron microscope Google Patents
patents.google.com
Tadashi Otaka, Hideo Todokoro: Applicant: Hitachi, Ltd. Export Citation: BiBTeX, EndNote, RefMan: Classifications (16), Legal Events (14) External Links: Espacenet
US A1 - Image evaluation method and microscope
patents.google.com
Image evaluation method capable of objectively evaluating the image resolution of a microscope image. An image resolution method is characterized in that...
EP A2 - Scanning electron microscope and method for production...
patents.google.com
... Tadashi Otaka: Applicant: Hitachi, Ltd. Export Citation: BiBTeX, EndNote, RefMan: Patent Citations (5), Non-Patent Citations (2), Referenced by (8 ...
DE D1 - Elektronenstrahl-Analysegerät Google Patents
patents.google.com
Inventors, Yoshitsugu Tsutsumi, Shinjiro Ueda, Tadashi Otaka. Applicant, Hitachi Ltd. Export Citation, BiBTeX, EndNote, RefMan. Classifications (6), Legal ...
DE T Electron analyzer - Google Patents
patents.google.com
Inventors, Yoshitsugu Tsutsumi, Shinjiro Ueda, Tadashi Otaka. Applicant, Hitachi Ltd. Export Citation, BiBTeX, EndNote, RefMan. Classifications (6). External ...
DE D Scanning microscope and operating method of such a...
patents.google.com
Inventors, Hideo Todokoro, Osamu Yamada, Tadashi Otaka. Applicant, Hitachi Ltd. Export Citation, BiBTeX, EndNote, RefMan. Classifications (11), Legal Events ...
EP A2 - Method and apparatus for generating electron channeling...
patents.google.com
Inventors, Tadashi Otaka. Applicant, Hitachi, Ltd. Export Citation, BiBTeX, EndNote, RefMan. Patent Citations (1), Non-Patent Citations (3), Classifications (4), ...
EP A3 - An electron beam apparatus Google Patents
patents.google.com
Inventors, Hideo Todokoro, Tadashi Otaka, Tatsuya Maeda, Katsuhiro Sasada. Applicant, Hitachi Ltd. Export Citation, BiBTeX, EndNote, RefMan.
EP A1 - Image evaluation system and charged particle beam...
patents.google.com
In an inspection device evaluation system or a charged particle beam microscope, a magnification error and a resolution evaluation value are calculated based...
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