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[PDF] Development of Polarization Imaging Sensing Technology for ...web-material3.yokogawa.com › tabs › rd-te-r

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(3) Tadao Tsuruta, Applied Engineering II, Baifukan, (in Japanese). Microscope image: 90° blue ⇨ 0° red. Polarization sensor image: 90° red ⇨ 0° blue.

[PDF] No.A Shimadzuwww.shimadzu.com › files › pim › applications › application_note

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Applied Optics (written by Tadao Tsuruta, Baifukan) s Absolute Reflectance of a Silicon Wafer Measured at Various Incident Angles.

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Optical fiber birefringence measurement method and ...

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Tadao Tsuruta, Ouyou Kougaku 2, pp , published by Baifukan Co., Ltd, no date. R. Clark Jones, “A New Calculus for the treatment of Optical Systems VI.

Variable Angle Absolute Reflectance System for SolidSpec-3700

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Applied Optics (written by Tadao Tsuruta, Baifukan) Absolute Reflectance of a Silicon Wafer Measured at Various Incident Angles NOTES: This Application News has been produced and edited using information that was available when the data was acquired for each article. This Application News is subject to revision without prior notice.

WO A1 - Polarization converting unit, illumination optical...

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1, TADAO TSURUTA: 'Ouyou Kogaku (Applied Optics) II' BAIFUKAN 1990,. Classifications. International Classification, G02B27/28, G02B Cooperative ...

US B2 - Optical fiber birefringence measurement method and...

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Non-patent Reference 2: Tadao Tsuruta, Ouyou Kougaku 2, pp , BAIFUKAN CO., LTD. Non-patent Reference 3: R. C. Jones, “A new calculus for the ...

WO A1 - Method and device of measuring double refraction of...

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9, TADAO TSURUTA: 'Ouyou Kougaku', vol. 2, BAIFUKAN CO., LTD pages , *, TANIKAWA S. ET AL.: 'Henpa OTDR o Mochiita Fiber Nagate Hoko ...

Optical Module - Patent application

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... wavelength of light, that is, in wavelength-angle dispersion characteristic (e.g. see Tadao Tsuruta, "Applied Optics 1", Baifukan Co., Ltd, 1990, ...

Патент на изобретение № bd.patent.su pat/servl/servlete5bb.html

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Ссылка на непатентный источник 2: Tadao Tsuruta, Ouyou Kougaku 2, стр , BAIFUKAN CO., LTD. Ссылка на непатентный источник 3: R.C. Jones, ...

METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND...

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... pages , XP TADAO TSURUTA: "Ouyou Kougaku 1 ( Applied Optics 1)", 1990, BAIFUKAN, CO. LTD., pages:

METHOD AND DEVICE OF MEASURING DOUBLE REFRACTION OF OPTICAL FIBER,...

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ZIMMER: 'POTDR, depolarization and detection of sections with large PMD' OFMC '95. TADAO TSURUTA: 'Ouyou Kougaku', vol. 2, BAIFUKAN ...

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