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Nanometrics Expands Position in Advanced Memory Devices ...
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“The Atlas MPU and Atlas III systems for thin film metrology significantly lowers overall cost-of-ownership and increases operational flexibility within volume manufacturing,” commented Dr. Srini Vedula, vice president, Thin Film & OCD Solutions, at Nanometrics.
Nanometrics Introduces Atlas for Thin Film Process Control -...
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Monitoring & Control: United States Oil & Gas news in North America, Nanometrics Introduces Atlas for Thin Film Process Control
Nanometrics Selected for Third-Generation 3D-NAND Process Control -...
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Software: United States Oil & Gas news in North America, Nanometrics Selected for Third-Generation 3D-NAND Process Control
Nanometrics Introduces the Atlas® III for Critical Dimension and Thin...
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Multiple Systems being Delivered, to Multiple Customers, for Every Leading-Edge Device Type
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