Rouwaida N. Kanj and Design - Free people check

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Nanoelectronic Circuit Design | Ellibs Library

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Rajiv Joshi, Keunwoo Kim, Rouwaida Kanj 4. A Hybrid Nano/CMOS Dynamically Reconfigurable System Wei Zhang, Niraj K. Jha, Li Shang 5. Reliable Circuits ...

Machine Learning in VLSI Computer-Aided Designbooks.google.com › books

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Chapter 11 Fast Statistical Analysis Using Machine Learning Rouwaida Kanj, Rajiv V. Joshi, Lama Shaer, Ali Chehab, and Maria Malik A model is a ...

More than Moore Technologies for Next Generation Computer Designbooks.google.com › books

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... Rajiv Joshi, Rouwaida Kanj, and Yiran Chen Abstract Spin-transfer torque random access memory (STT-RAM) has recently gained increased attention from ...

Nanoelectronic Circuit Design - Google Books

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Rajiv Joshi, Keunwoo Kim, and Rouwaida Kanj Abstract We present a comprehensive review of finFET devices taking into consideration different levels of ...

Finfet Sram Design (Invited): Rajiv Joshi, Fellow, Ieee Scribdwww.scribd.com › document › Rajiv-Joshi-Fellow-IEE...

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Rajiv Joshi, Fellow, IEEE, Keunwoo Kim, Senior Member, IEEE, 1 Rouwaida Kanj, Member, IEEE - Free download as PDF File (.pdf), Text File ...

The Impact of Statistical Leakage Models on Design Yield Estimation

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Device mismatch and process variation models play a key role in determining the functionality and yield of sub-100 nm design. Average characteristics...

Importance Sampling-Based Estimation: Applications to Memory Design |...

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In this chapter, we describe a state-of-the-art simulation-based methodology for statistical SRAM design and analysis. It relies on mixture importance...

Table of Contents - Page 10 | VLSI Design | Hindawiwww.hindawi.com › journals › vlsi › contents › page

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Rouwaida Kanj | Rajiv Joshi | Sani Nassif. 22 Feb 2011; PDFDownload PDF · CitationDownload citation · VLSI Design -; Special Issue; Volume

FinFET SRAM Design | SpringerLink

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We present a comprehensive review of finFET devices taking into consideration different levels of interest ranging from the physics of FinFET devices, design...

All web results to the name "Rouwaida N. Kanj"

US A1 - Technology Computer-Aided Design ...www.google.com.na › patents

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United States. Patent application publication. Download PDF Find Prior Art Similar. Inventor: Rajiv V. Joshi: Rouwaida N. Kanj: Keunwoo Kim; Current Assignee.

US B2 - Technology computer-aided design (TCAD ...patents.google.com › patent

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Download PDF Find Prior Art Similar. Inventor: Rajiv V. Joshi: Rouwaida N. Kanj: Keunwoo Kim; Current Assignee. The listed assignees may be inaccurate.

Rouwaida Kanj, *Rajiv Joshi, and Sani Nassif - ppt downloadslideplayer.com › slide

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Mixture Importance Sampling and Its Application to the Analysis of SRAM Designs in the Presence of Rare Failure Events Rouwaida Kanj, *Rajiv Joshi, and Sani ...

DAC KanjJN - BibSLEIGHbibtex.github.io › DAC KanjJN

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Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare ...