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News
Deft hand at exciting jobs - The Economic Times
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Chip-designing is ascending tougher scales of complexity.
DBLife: Nagesh Tamarapalli News Archive
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Return to Nagesh Tamarapalli's Superhomepage. No news available. DBlife. Developed by the Database Group at the University of Wisconsin and Yahoo!
VLSI-SATA : International Conference on VLSI Systems,...
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VLSI-SATA : International Conference on VLSI Systems, Architecture, Technology and Applications
Conference Program | Design Automation Conference
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Erhan Ergin - Advanced Micro Devices, Inc., Brooklyn, NY Nagesh Tamarapalli - Advanced Micro Devices, Inc., Bengaluru, India Silqun Leung - Advanced Micro ...
Telephone & Addresses
Nagesh Tamarapalli, 47, Newberg, US, NE Kincaid Rd
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Nagesh Tamarapalli, 47, Tualatin, US, SW Nyberg Ln
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Nagesh Tamarapalli, 47, Tualatin, US, SW Pueblo St
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Nagesh Tamarapalli, 47, Wilsonville, US, SW Boeckman Rd
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Network Profiles
LinkedIn: Nagesh Tamarapalli | LinkedIn
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Nagesh Tamarapalli - Semantic Scholar
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Semantic Scholar profile for Nagesh Tamarapalli, with 112 highly influential citations.
DBLife: Nagesh Tamarapalli
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Interests
Nagesh Tamarapalli - Patents
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Nagesh Tamarapalli patents Recent bibliographic sampling of Nagesh Tamarapalli patents listed/published in the public domain by the USPTO (USPTO Patent ...
Business Profiles
patentbuddy: Nagesh Tamarapalli
MENTOR GRAPHICS CORPORATION, Wilsonville, OR, US
Nagesh Tamarapalli | Newberg, Oregon
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Find information about caller Nagesh Tamarapalli owner of phone number from Newberg, OR, US
Books & Literature
SCEAS
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Nagesh Tamarapalli: [Publications] [Author Rank by year] Wu-Tung Cheng
Kun-Han Tsai
Yu Huang
Nagesh Tamarapalli
Brady Benware
Chris Schuermyer
Sreenevasan ...
Robert Madge
Microelectronics Failure Analysis: Desk Reference - EDFAS Desk...
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Includes bibliographical references and index.
Istfa 2005: Proceedings of the 31st International Symposium for...
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Chris Eddleman LSI Logic Corporation, Fort Collins, CO USA Nagesh Tamarapalli and Wu-Tung Cheng Mentor Graphics Corporation, Wilsonville, OR USA ...
ISTFA 2006: Proceedings of the 32nd International Symposium for...
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... and Yuan-Shih Chen Taiwan Semiconductor Manufacturing Company, Hsinchu Taiwan R.O.C. Nagesh Tamarapalli*, Wu-Tung Cheng, Jan Tofte, and Martin ...
Related Documents
Power Optimization with Efficient Test Logic Partitioning for Full Ch…
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This paper introduces efficient test logic partitioning to not only optimize and reduce the overall test power during silicon validation but also reduce power …
Semiconductor integrated circuit with test points inserted thereinto...
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A semiconductor integrated circuit device includes a logic circuit having a plurality of observation points and a control point, a plurality of scan cells, a...
CiteSeerX — Impact of Multiple-Detect Test Patterns on Product Quality
citeseerx.ist.psu.edu
... {Brady Benware and Chris Schuermyer and Sreenevasan Ranganathan and Robert Madge and Prabhu Krishnamurthy and Nagesh Tamarapalli and Kun-han Tsai ...
ATS 20th Anniversary Compendium - UMass Amherst
www.ecs.umass.edu
Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, and Janusz Rajski Test Power Reduction with Multiple Capture Orders Kuen-Jong Lee, Shaing-Jer …
Scientific Publications
DBLP - Nagesh Tamarapalli
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Nagesh Tamarapalli. Found 19 results. sorted by: number of citations Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, ... Kun Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan
dblp: Asian Test Symposium 2004
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Bibliographic content of Asian Test Symposium 2004
Publications
Impact of Multiple-Detect Test Patterns on Product Quality - CORE
core.ac.uk
· By Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-han Tsai and Janusz Rajski
Improving Transition Fault Test Pattern Quality through At-Speed...
core.ac.uk
By U Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-tung Cheng, Alex Babin, Kun-han Tsai, Nagesh Tamarapalli and Greg ...
Reports & Statements
Interview with Mentor Graphics - EDN
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Greg Aldrich, Product Marketing Manager, and Nagesh Tamarapalli, Technical Marketing Engineer. T&MW: What's the future for standard ...
IEEE P1500 Embedded Core Test Working Group Meetings
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Nagesh Tamarapalli : Mentor Graphics Nur Touba : University of Texas Jon Udell : Symbios Logic Ron Walther : IBM Lee Whetsel : Texas ...
IEEE P1500 Embedded Core Test Working Group Meeting
grouper.ieee.org
Nagesh Tamarapalli: Mentor Nur Touba: Univ. of Texas at Austin Jerzy Tyszer: Poznain Univ. of Tech. Jon Udell: Palmchip Corp. Prab Varma: Duet Technologies
Miscellaneous
Nagesh Tamarapalli | LinkedIn
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View Nagesh Tamarapalli's professional profile on LinkedIn. LinkedIn is the world's largest business network, helping professionals like Nagesh Tamarapalli discover ...
US B1 - Phase shifter with reduced linear dependency
patents.google.com
Janusz Rajski, Jerzy Tyszer, Nagesh Tamarapalli: Original Assignee: Janusz Rajski, Jerzy Tyszer, Nagesh Tamarapalli: Export Citation: BiBTeX, EndNote, RefMan:
US B2 - Semiconductor integrated circuit with test points...
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A semiconductor integrated circuit device includes a logic circuit having a plurality of observation points and a control point, a plurality of scan...
ATPG - test pattern generation process 1. Target faults 2. Generate...
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Scan/ATPG - non-embedded solution ATE stimuli The same width The same frequency ATE reference Mirror images: ATE and scan
ATS Call for Papers Broadcast Request - Yahoo Groups
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Virendra Singh, India Institute of Science India. Chau-Chin Su, National Central University, Taiwan. Nagesh Tamarapalli, Mentor Graphics USA.
Nagesh Tamarapalli in Wilsonville, OR - Listing Details - Yellow...
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Nagesh Tamarapalli is located in Wilsonville OR according to public information records. First Name, Phone Number, Name Origin and Meaning for the person...
EP A4 - Compactor independent fault diagnosis Google...
patents.google.com
Inventors, Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski. Applicant, Mentor Graphics Corp. Export Citation, BiBTeX, EndNote, ...
US A - Avoiding instability Google Patents
patents.google.com
Described are techniques to stabilize storage devices receiving signals from plural asynchronous docks, especially to avoid
DE D Phase shifter with reduced linear dependence
patents.google.com
Inventors, Janusz Rajski, Jerzy Tyszer, Nagesh Tamarapalli. Applicant, Mentor Graphics Corp. Export Citation, BiBTeX, EndNote, RefMan. Classifications (14) ...
Nagesh Tamarapalli Archives - Evaluation Engineering
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Mentor Graphics Scan diagnostics play an important role in improving yield. As technologies move below 130 nm, the IC industry has seen a ...
WO A3 - Integrated circuit yield and quality analysis...
patents.google.com
Applicant, Gang Chen, Martin Keim, Mentor Graphics Corp, Janusz Rajski, Manish Sharma, Nagesh Tamarapalli, Huaxing Tang.
US A1 - Method and apparatus for at-speed testing of...
patents.google.com
Inventores, Janusz Rajski, Abu Hassan, Robert Thompson, Nagesh Tamarapalli. Beneficiário Original, Janusz Rajski, Abu Hassan, Robert Thompson, Nagesh ...
US B1 - Digital power-up reset circuit Google Patents
patents.google.com
2002, Nagesh Tamarapalli, Circuit for switching between multiple clocks. US *, 1. Mai 2006, 25. März 2008, Taiwan Semiconductor Manufacturing Co., ...
TDGS - "Nagesh Tamarapalli"
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Tutorial T5: High Performance Low Power Designs - Challenges and Best practices in Design, Verification and Test
Embedded deterministic test for low cost manufacturing test -...
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Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski*,GeirEide1,andJunQian** Mentor Graphics Corporation S.W. Boeckman Road Wilsonville, OR , USA *Poznan ...
Figure 9 from A Rapid Yield Learning Flow Based on Production...
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Figure 9: Comparison of failure rate of various types of bridges in two lot groups -
[PDF] High-frequency, at-speed scan testing | Semantic Scholar
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New strategies where at-speed scan tests can be applied with internal PLL and methodologies to combine both stuck-at-fault and delay-test vectors into an...
DBLP: Yu Huang
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Yu Huang List of publications from the DBLP Bibliography Server - FAQ , Yu Huang, Nagesh Tamarapalli, Janusz Rajski: Compactor Independent Direct Diagnosis.
AERCS - Person information
tosini.informatik.rwth-aachen.de
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (IEEE Transactions on Computer-Aided Design of Integrated Circuits and ...
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