Joachim Müssig and Thomas Schroeder - Free people check

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On the electronic and dielectric characterisation of thin cubic ...

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by O Seifarth — Hans- Joachim Müssig. 1. , and. Thomas Schroeder IHP microelectronics, Frankfurt (Oder), Germany. 2. Brandenburg Technical University, › dpg › seifahrt

Microelectronic Engineering | Alternative semiconductor integration...

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Edited by Hans-Joachim Müssig, Thomas Schroeder, Giovanni Capellini, Roger Loo, Jean Fompeyrine. Volume 125, Pages (1 August 2014). Previous vol/ ...

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Thermal oxidation of chemical vapour deposited tungsten ...

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Jun 1, — Rakesh Sohal, Christian Walczyk, Peter Zaumseil, Dirk Wolansky, Alexander Fox, Bernd Tillack, Hans-Joachim Müssig, Thomas Schroeder. › paper

Dielectric Properties of Thin Hf- and Zr-based Alkaline Earth...

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Hans-Joachim Müssig, and Thomas Schroeder; Dielectric Properties of Thin Hf- and Zr-Based Alkaline Earth Perovskite Layers Meet. MA (25):

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Hans-Joachim Müssig, and Thomas Schroeder; Dielectric Properties of Thin Hf- and Zr-based Alkaline Earth Perovskite Layers ECS Trans (6): ...

Interface Properties of PrxAl2-xO3 (x = 0 to 2) Dielectrics on TiN...

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... Volume Grzegorz Lupina, Thomas Schroeder, Christian Wenger, Jarek Dabrowski, Gunther Lippert, Hans-Joachim Müssig.

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Joachim Müssig and Thomas Schroeder Free People Check