Jeff Roehr and Texas Instruments - Free people check

(1 - 9 from 10

)

DATA IEEE International Workshop on Defect ...conference.researchbib.com › view › event

conference.researchbib.com

Technical Program Submissions: Jeff Roehr Texas Instruments E-mail: jlroehr-AT -gmail.com. Visit our www site at: http://data.tttc-events.org/

ETS Program

www.ets16.nl

Jeff Roehr (Texas Instruments, ...

Conference program

www.ets16.nl

Jeff Roehr (Texas Instruments, USA) Test Experiences in Targeting Entitlement Yield Stefan Eichenberger ... Program. Conference program; Keynotes; Embedded Tutorials;

Conference program - IEEE European Test Symposiumwww.ieee-ets.org › past_events › ets16 › conference-program

www.ieee-ets.org

Test it to Break it. Jeff Roehr (Texas Instruments, USA); Test Experiences in Targeting Entitlement Yield Stefan Eichenberger (NXP, Germany/The Netherlands).

BiTS Workshop Archive Program

www.testconx.org

Jeff Roehr. Jeffrey Roehr. Senior Member of Technical Staff. Texas Instruments. This tutorial is designed to give attendees useful and practical information on the ...

IEEE Workshop on Defect and Date Driven Testing (D3T)

data.tttc-events.org

Final Program Day 1 – Thursday, Nov 8th . 4:00pm – Opening Remarks. Jeff Roehr (Texas Instruments), General Chair DATA Arani Sinha (Intel), Program Chair