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Images of Hisae Shibuya
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News
DMIN'13 Programme
www.dmin-2013.com
DMIN'13 Conference Programme/Schedule. DMIN'13 CONFERENCE SCHEDULE (RED = new; ... Hisae Shibuya Wakayama University, Japan 09: :00am: A ...
Network Profiles
Interests
Hisae SHIBUYA - Patents
www.freshpatents.com
Recent bibliographic sampling of Hisae SHIBUYA patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title):
Hisae Shibuya - Patent Inventor
www.freshpatents.com
List of recent Hisae Shibuya patent applications
Business Profiles
patentbuddy: Hisae Shibuya
HITACHI HIGH-TECHNOLOGIES CORPORATION, Chigasaki, JP
Books & Literature
ken-system: - All Technical Committee Conferences - All Years
ken.ieice.org
Takahiro Takamiya, Toshikazu Wada (Wakayama Univ.), Shunji Maeda, Hisae Shibuya (Hitachi,Ltd.) It is often pointed out by researchers working on similar image search that human and computer similarity measures are q...
Data Mining
styluspub.presswarehouse.com
... to Anomaly Detection—Toshikazu Wada, Yuki Matsumura, Shunji Maeda, Hisae Shibuya 5) A Study of kNN using ICU Multivariate Time Series Data—Dan Li, ...
Related Documents
Practical Pattern Detection from Distributed Defect Points on a...
researchr.org
@inproceedings{ShibuyaT02, title = {Practical Pattern Detection from Distributed Defect Points on a Semiconductor Wafer}, author = {Hisae Shibuya and Yuji ...
CiteSeerX — STATISTICAL THRESHOLD METHOD FOR SEMICONDUCTOR INSPECTION
citeseerx.ist.psu.edu
STATISTICAL THRESHOLD METHOD FOR SEMICONDUCTOR ... {Akira Hamamatsu and Hisae Shibuya and ... {STATISTICAL THRESHOLD METHOD FOR SEMICONDUCTOR INSPECTION…
Eigo Sato - PDF documents
www.documbase.com
Hiroshi sako (hosei university), shigeru sasaki (fujitsu), yoichi sato (the university of tokyo), eigo segawa (fujitsu), shuji senda (nec), hisae shibuya (hitachi).
Scientific Publications
dblp: Machine Vision Applications 2002
dblp.uni-trier.de
Bibliographic content of Machine Vision Applications 2002
Miscellaneous
Accepted Papers - cjkpr2010
sites.google.com
Masashi Ando, Masaki Nakajima, Seiji Hotta, Hisae Shibuya and Shunji Maeda Likelihood Histogram for Fault Detection: Yosuke Shimizu and Seiji Hotta Rare Cell Detection Using Shape Features: Hiroto Minegishi and Seiji Hotta Image Classification Based on Vote Histograms: Hee Kyung Yang, Jae Wan Park, Jong Gu Kim, Yoon ji Choi and Chil-Woo Lee
Detailed Program - QCAV2013
sites.google.com
Shoichi Kondo, Shun'ichi Kaneko (Hokkaido University), Shunji Maeda (Hiroshima Institute of Technology), Hisae Shibuya (Hitachi, Ltd. Yokohama Research …
Technical Program - cjkpr2010
sites.google.com
(ThP1-02) Likelihood Histogram for Fault Detection, Masashi Ando, Masaki Nakajima, Seiji Hotta, Hisae Shibuya, and Shunji Maeda (ThP1-03) Image Classification Based on Vote Histograms, Hiroto Minegishi and Seiji Hotta (ThP1-04) Fashion Coordinator System using Color Pattern, Donghyun Kim, Hyun-Tae Jo, Jaehwa Park, and Young-Bin Kwon
Hisae Shibuya, Chigasaki JP - Patent applications
www.patentsencyclopedia.com
Patent application number Description Published; : Visual Inspection Method and Apparatus and Image Analysis System - An image feature is calculated based
Hisae Shibuya - Patent applications
www.patentsencyclopedia.com
Patent application number, Description, Published , Visual Inspection Method and Apparatus and Image Analysis System - An image feature is ...
Electric Power Generation and Transmission Technologies ...
www.hitachi.com
Tadashi Suzuki / Tojiro Noda / Hisae Shibuya, Dr. Info. / Hideaki Suzuki Development of New Technology for Fukushima Daiichi Nuclear Power Station Reconstruction Hirofumi Kinoshita / Ryuichi Tayama, Dr. Eng. / Yutaka Kometani / Takashi Asano / Yuko Kani, Dr. Sc. Efforts to Improve Safety of Nuclear Power Plants
WO A1 - 欠陥分類方法及びその装置 Google Patents
patents.google.com
外観検査の欠陥分類において、重要欠陥のピュリティまたはアキュラシーまたはその両方が目標値以上になるように調整するなどのニーズがあるが、教示型の欠陥分類は平均的に分類正解率が高くなるよう条件設定されるため、そのようなニーズに応えられないという問題があった。...
US B2 - Determining design coordinates for wafer defects...
patents.google.com
Hisae Shibuya: Method for analyzing defect data and inspection apparatus and review system: US : 7 Jun 2001: 12 Dec 2002: Hoon Tan Seow: System and …
US A1 - Defect classification method and apparatus, and...
patents.google.com
A defect classification method to classify defects by using a classifier having a binary tree structure based on features of defects extracted from...
EQUIPMENT STATUS MONITORING METHOD, MONITORING SYSTEM, AND MONITORING...
www.patentsencyclopedia.com
Patent application title: EQUIPMENT STATUS MONITORING METHOD, MONITORING SYSTEM, AND MONITORING PROGRAM Inventors: Hisae Shibuya (Chigasaki, JP) Hisae Shibuya
ken-system: Connection between Gaussian Processes and ...
ken.ieice.org
Shinsaku Ozaki, Toshikazu Wada (Wakayama Univ.), Shunji Maeda, Hisae Shibuya : Abstract (in Japanese) (See Japanese page) (in English) Anomaly detection can be applied to health monitoring of industrial plants, human medical conditions, vehicle conditions, and so on.
Visual Inspection Method and Apparatus and Image Analysis System -...
www.patentsencyclopedia.com
Patent application title: Visual Inspection Method and Apparatus and Image Analysis System Inventors: Hisae Shibuya (Chigasaki, JP) Hisae Shibuya (Chigasaki, JP ...
EP A4 - Error detection method and system Google...
patents.google.com
... EP A4, EP A4, EP-A , EP , EP , EP A4, EP A4. Inventors, Shunji Maeda, Hisae Shibuya.
US A1 - Apparatus of inspecting defect in semiconductor and...
patents.google.com
When size of a defect on an increasingly miniaturized pattern is obtained by defect inspection apparatus in the related art, a value is inconveniently...
EP A Health management system, fault diagnosis...
data.epo.org
... SHINSAKU OZAKI; TOSHIKAZU WADA; SHUNJI MAEDA; HISAE SHIBUYA: 'Connection between Gaussian Processes and Similarity Based ...
Document Outline
worldcomp-proceedings.com
Toshikazu Wada, Yuki Matsumura, Shunji Maeda, Hisae Shibuya A Study of kNN using ICU Multivariate Time Series Data Dan Li, Admir Djulovic, Jianfeng Xu
Graduate School of Information Science and Technology, HOKKAIDO...
docplayer.net
... Masatsugu Takemoto Shunsuke Komizunai Eiichi Tanaka Masahiro Watanabe (visiting) Hisae Shibuya (visiting) Associate Takeo Tadono (visiting) Masahiro ...
US B1 - Electronic device for the control of moving elements in...
patents.google.com
US *, 2 Apr 2001, 25 Apr 2002, Hisae Shibuya, Method for evaluating color picture tubes and device for the same and method for making color ...
US B2 - Report format setting method and apparatus, and defect...
patents.google.com
Generated is a template edition screen on which to display components of a report as modules by OSD by use of icons. One of the icons is selected by use...
US B2 - Integrated circuit layout critical area determination...
patents.google.com
Method, system and program product for determining a critical area in a region of an integrated circuit layout using Voronoi diagrams and shape biasing....
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