Helmut Puchner and Siegfried Selberherr - Free people check

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Electrochemical Processes in ULSI and MEMS: Proceedings of the...

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Clemens Heitzinger, Alireza Sheikholeslami, Helmut Puchner, and Siegfried Selberherr. Predictive simulation of void formation during the deposition of silicon ...

VLSI Circuits and Systems | (2003) | Publications | Spie

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Author(s): Alireza Sheikholeslami; Clemens Heitzinger; Helmut Puchner; Fuad Badrieh; Siegfried Selberherr

All web results to the name "Helmut Puchner"

‪Siegfried Selberherr‬ - ‪Google Scholar‬

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‪Institute for Microelectronics, TU Wien‬ - ‪‪Cytowany przez ‬‬ - ‪Microelectronics‬ - ‪Spintronics‬ - ‪Semiconductor Devices‬ - ‪Simulation‬

Vassil Palankovski - Google Scholar Citations

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KoautorenAlle anzeigen… Siegfried Selberherr,; Tibor Grasser,; Dragica Vasileska,; Nicolas Grandjean,; Abel Garcia Barrientos,; Helmut Puchner,; christian ...

From feature scale simulation to backend simulation for a 100 nm CMOS...

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Fuad Badrieh, Helmut Puchner, Clemens Heitzinger, Alireza Sheikholesiami, Siegfried Selberherr. Research output: Chapter in Book/Report/Conference ...

Simulation of void formation in interconnect lines — Arizona State ...asu.pure.elsevier.com › publications › simulation-of-vo...

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Alireza Sheikholeslami, Clemens Heitzinger, Helmut Puchner, Fuad Badrieh, Siegfried Selberherr. Research output: Chapter in Book/Report/Conference ...