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Calit2 : California Institute for Telecommunications and Information...
www.calit2.net
FE-SEM Technology: Guest Speaker: Heiner Jaksch staff scientist, International Business Development Manager, Carl Zeiss gmbH. Date: May 5th, 2009to May 5th, …
Programme
fy.chalmers.se
A preliminary programme for the course is available here >> - SEM Programme, prliminary 2.pdf. Lab stations was: 1) Zeiss Ultra FEG-SEM; Heiner Jaksch (Zeiss)
FE-SEM Technology - Qualcomm Institute - UC San Diegoqi.ucsd.edu › events › event
qi.ucsd.edu
Location: Calit2 Building, Room 3008, UC Irvine. Guest Speaker: Heiner Jaksch staff scientist, International Business Development Manager, Carl Zeiss gmbH.
Carl Zeiss aktuell: News und Informationen der FAZ zum Thema
www.faz.net
News zu Carl Zeiss im Überblick: Hier finden Sie alle Meldungen und Informationen der FAZ zum Thema Carl Zeiss.
Interests
Heiner Jaksch - Patents
www.freshpatents.com
Heiner Jaksch patents Recent bibliographic sampling of Heiner Jaksch patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title):
Business Profiles
patentbuddy: Heiner Jaksch
CARL ZEISS NTS GMBH, Heidenheim, DE
Books & Literature
EMC th European Microscopy Congress 1–5 September 2008,...
www.ellibs.com
Ellibs E-kirjakauppa - E-kirja: EMC th European Microscopy Congress 1–5 September 2008, Aachen, Germany - Tekijä: Luysberg, Martina - Hinta: 219,95€
Advanced Characterization Techniques for Thin Film Solar Cellsbooks.google.com › books
books.google.de
Special thanks are due to Heiner Jaksch (Carl Zeiss NTS) and to Michael Lehmann (TU Berlin) for fruitful discussions and critical reading of the manuscript.
EMC 2008: Vol 1: Instrumentation and Methodsbooks.google.com › books
books.google.de
Low Loss BSE imaging with the EsB Detection system on the Gemini Ultra FE-SEM Heiner Jaksch Carl Zeiss SMT–Nano Technology System Div., ...
GraphITA 2011: Selected papers from the Workshop on ...books.google.com › books
books.google.de
The thickness of the monolayer graphene is 2.42Å (SEM performed by Dr. Heiner Jaksch, Carl Zeiss NTS GmbH, Oberkochen, Germany) Fig. 4 The G' spectra of ...
Related Documents
Ancient soils guide future sustainability The AMMRF on the ...
li155-94.members.linode.com
Synchrotron, Dr heiner Jaksch from Carl Zeiss, and Dr Shane Kennedy from ANSTO. This mix of speakers allowed wide coverage of topics in.
EDO Herbsttagung Programm - von Oberflächen (EDO)www.edo.uni-wuppertal.de › Jaksch
www.edo.uni-wuppertal.de
Dr. Heiner Jaksch. LEO Elektronenmikroskopie GmbH, Oberkochen. Low Voltage und Super Low Voltage Abbildung mit dem neuen LEO Gemini FE-SEM.
EMAS 'Book of Abstracts' - EMAS - European Microbeam Analysis...
www.microbeamanalysis.eu
EMAS - The European Microbeam Analysis Society. Education, Communication and Innovation. EMAS is a society run for and by scientists.
Invited IT-4-IN A review of SE and BSE imaging in SEM ...www.microscopy.cz › abstracts
www.microscopy.cz
explored recently, particularly through the research of the late Heiner Jaksch in exploring the low angle BSE signals with 'unconventionally' short working ...
Scientific Publications
New Detection System for GEMINI | Microscopy and Microanalysis |...
www.cambridge.org
New Detection System for GEMINI - Volume 10 Issue S02 - Michael Dieter Gerhard Steigerwald, Rainer Arnold, Johannes Bihr, Volker Drexel, Heiner Jaksch, Dirk...
Micron | Vol 40, Issue 7, Pages (October 2009) |...
www.sciencedirect.com
... fungal spores and stained section-face by low-loss backscattered electron imaging. Original research article: Pages Ki Woo Kim, Heiner Jaksch.
Improved Electrophoretic Deposition of Vertical Single Wall ...www.ncbi.nlm.nih.gov › pmc › articles › PMC
www.ncbi.nlm.nih.gov
The authors would also like to thank Heiner Jaksch of Carl Zeiss for performing the high-resolution SEM of the short nanotubes deposited in ...
Publications
Publications Authored by Heiner Jaksch | PubFacts
www.pubfacts.com
Publications Authored by Heiner Jaksch
Heiner Jaksch
spie.org
SPIE Profile of Heiner Jaksch, Carl Zeiss AG. SPIE Profiles is a networking platform for optics and photonics professionals.
Low Loss BSE imaging with the EsB Detection system on the Gemini...
link.springer.com
The sensitivity of the GEMINI Inlens detection systems is worldwide known. Especially the EsB detection provides compositional contrast down to the ppm level...
Compositional contrast of uncoated fungal spores and stained...
www.biomedsearch.com
Comparative surface imaging was performed on uncoated fungal spores and stained section-face by field emission scanning electron microscopy with an in-column...
Reports & Statements
Historia en minúsculas (I) | Esto no es la biblioteca de Alejandría
estonoeslabale.wordpress.com
1: Ludwig Jonas, Heiner Jaksch, Erhard Zellmann, Kerstin I. Klemm y Peter Hvilshoj Andersen. Detection of mercury in the 411-years-old beard hairs of the ...
December News from Center for Nanoscale Systems
archive.constantcontact.com
Dr. Heiner Jaksch - Carl Zeiss SMT Staff Scientist Center for Nanoscale Systems - Harvard University Oxford St., LISE Cambridge, MA
Microscopical Society of Canada Annual meeting | Scientist...
www.scientistsolutions.com
Invited lectures include: Ray Egerton (EELS),Takeo Kamino (environmental and in-situ TEM), David Joy and Heiner Jaksch (SEM), Robert Glaeser, David ...
Miscellaneous
US B2 - Detector system for a scanning electron microscope and...
patents.google.com
Heiner Jaksch, Johannes Bihr: Original Assignee: Carl Zeiss Nts Gmbh: Export Citation: BiBTeX, EndNote, RefMan: Patent Citations (10), Non-Patent Citations (3
EP A1 - Silicon Drift Detector for use in a charged particle...
patents.google.com
For use in a charged particle apparatus such as a SEM, a STEM or a FIB, ... Heiner Jaksch: Method and particle beam device for producing an image of an object
US A1 - Detector system for a scanning electron microscope...
patents.google.com
Original Assignee, Heiner Jaksch, Johannes Bihr. Export Citation, BiBTeX, EndNote, RefMan. Patent Citations (6), Referenced by (5), Classifications (12), Legal ...
MSA M&M 2011: Full Symposia Descriptions & Program Information
www.microscopy.org
Heiner Jaksch, Carl Zeiss; Raynald Gauvin, McGill University; This symposium will cover: Developments in conventional and in-lens secondary electron detectors;
MSA Microscopy & Microanalysis (2012) Program Information
www.microscopy.org
Heiner Jaksch, Carl Zeiss NTS, Germany; Leslie Allen, University of Melbourne, Australia; Marc de Graef, Carnegie Mellon University; Nestor J. Zaluzec, Argonne
Scientific and Clinical Applications of Magnetic Carriers >...
www.magneticmicrosphere.com
Daniela Sudfeld, Inga Ennen, Andreas Hütten, Ute Golla-Schindler, Heiner Jaksch, Günter Reiss, Daniel Meißner, Klaus Wojczykowski, Peter Jutzi,
Giftmord - Translation from German into English | PONSen.pons.com › translate › german-english › Giftmord
en.pons.com
Jetzt ist es einem Team um Heiner Jaksch von Carl Zeiss und Pathologen der Universität Rostock um Professor Rudolf Wegener jedoch gelungen, Kepler zu ...
Verdacht entlasten - Deutsch-Englisch Übersetzung | PONS
de.pons.com
Übersetzung Deutsch-Englisch für Verdacht entlasten im PONS Online-Wörterbuch nachschlagen! Gratis Vokabeltrainer, Verbtabellen, Aussprachefunktion.
WO A2 - Detector system for a scanning electron microscope...
patents.google.com
Other languages: German: French; Inventor: Heiner Jaksch: Johannes Bihr; Original Assignee: Carl Zeiss Nts Gmbh; Priority date. The priority date is an ...
US B2 - Raster electron microscope - Google Patentswww.google.com › patents
patents.google.com
US A1 * Heiner Jaksch Detector system for a scanning electron microscope and a scanning electron microscope ...
P1 Piotr Bała, Katja Tsyrulin, Heiner Jaksch 3D reconstruction and...
docplayer.pl
Poster session P1 Piotr Bała, Katja Tsyrulin, Heiner Jaksch 3D reconstruction and characterization of carbides in Ni based high carbon alloy in a FIB/SEM ...
Heiner Jaksch
www.infona.pl
Compositional contrast of uncoated fungal spores and stained section-face by low-loss backscattered electron imaging · Ki Woo Kim, Heiner Jaksch.
Heiner Jaksch — NYU Scholarsnyuscholars.nyu.edu › publications › heiner-jaksch
nyuscholars.nyu.edu
Original language, English (US). Pages (from-to), 15. Journal, Imaging and Microscopy. Volume, 15. Publication status, Published
AGH - ZEISS Workshop on Focused Ion Beam techniques ...docplayer.net › Agh-zeiss-workshop-on-foc...
docplayer.net
... (ZEISS) CrossBeam technology: an overview : coffee break : Dr Fabian Perez-Willard (ZEISS) Applications of CrossBeam : Dr Heiner Jaksch (ZEISS) Low loss ...
A Novel Gemini® STEM Detector System | Microscopy Today | Cambridge...
www.cambridge.org
A Novel Gemini® STEM Detector System - Volume 13 Issue 3
Bio일정 - BRICwww.ibric.org › bio_schedule1 › print
www.ibric.org
... 칼자이스) 10:00-11:00 (강의) FESEM의 고급 응용 (Dr. Heiner Jaksch, Carl Zeiss) 11:00-11:15 휴식 11:15-12:00 (강의) FESEM의 바이오분야 응용 (김기우 박사, ...
Abstract: IT-4-IN-5709
www.microscopy.cz
The angular sensitivity of BSE imaging has also been explored recently, particularly through the research of the late Heiner Jaksch in exploring the low angle ...
Previous Annual Meetings | ISM – 43rd annual meeting
www.ismicroscopy.org.il
Previous Annual Meetings; ISM2015; People. Committee Members; Past ISM Board Members; Honorary Life Members; ... Dr. Heiner Jaksch, Carl Zeiss NTS GmbH, …
Heiner - Patent applications
www.patentsencyclopedia.com
Heiner Jaksch, Heidenheim DE. Patent application number Description Published; : METHOD AND PARTICLE BEAM DEVICE FOR PRODUCING AN IMAGE OF AN OBJECT - A
Advanced Characterization Techniques for Thin Film Solar Cells - PDF...
epdf.tips
Edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau Advanced Characterization Techniques for Thin Film Solar Cells...
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