Publications ( ) - Turro Home Page
turroserver.chem.columbia.edu
Hernan R. Rengifo, Cristian Grigoras, Benjamin I. Dach, Xia Li, Nicholas J. Turro, Hae-Jeong Lee, Wen-Li Wu, and Jeffrey T. Koberstein, "Solid Phase Synthesis ...
Pore size distributions in low-k dielectric thin...
onlinelibrary.wiley.com
Pore size distributions in low-k dielectric thin films from X-ray porosimetry. Hae-Jeong Lee, Christopher L. Soles, Da-Wei Liu, Barry J. Bauer * and; Wen-Li Wu;
Loading on Structure of Porous Thin Films Effect...
www.ncnr.nist.gov
Effect of Porogen Molecular Architecture and Loading on Structure of Porous Thin Films Hae-Jeong Lee, Christopher L. Soles,* Bryan D. Vogt,† Da-Wei Liu, Wen-li Wu, and
Recent Novel X-ray Reflectivity Techniques
www.nims.jp
[12] Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, and Wen-li Wu, NIST Special Publication (2004). [13] P. Croce and L. Nevot, J. Appl. Cryst., 7, ...
Surface Modification and Electrical Characterization of ...
shodhganga.inflibnet.ac.in
Hae-Jeong Lee, Eric K. Lin, Howard Wang, Wen-li Wu, Wei Chen, and Eric S. Moyer, Chem. Mater. 14, (2002) Y.L. Cheng ,Y.L. Wang, C.P. Liu, ...
Moisture absorption into ultrathin hydrophilic polymer films on...
www.deepdyve.com
Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, Wen-li Wu. Polymers Division, National Institute of Standards and Technology, 100 Bureau Dr MS 8541, ...
Cambridge Journals Online - MRS Online Proceedings...
journals.cambridge.org
Hae-Jeong Lee a1, Eric K. Lin a1, Howard Wang a1, Wen-Li Wu a1, Wei Chen a2 and Thomas A. Deis a2. a1 National Institute of Standards and Technology, Polymers
Cover image - ScienceDirect
www.sciencedirect.com
Original Research Article; Pages ; Bryan D. Vogt, Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, Wen-li Wu. Abstract; PDF (177 K). Entitled to full ...
X-ray Porosimetry as a Metrology to Characterize The Pore ...
extras.springer.com
Christopher L. Soles, Hae-Jeong Lee, Ronald C. Hedden, Da-Wei Liu, Barry J. Bauer, and Wen-li Wu. Polymers Division, National Institute of Standards and ...
Structure and property characterization of low-k dielectric porous...
link.springer.com
... and property characterization of low-k dielectric porous thin films. Barry J. Bauer,; Eric K. Lin,; Hae-Jeong Lee,; Howard Wang,; Wen-Li Wu … show all 5 hide.
All web results to the name "Hae-Jeong Lee"
Eric K. Lin, and Wen-li Wu
nvlpubs.nist.gov
Pore Characterization in Low-k Dielectric Films Using X-ray Reflectivity: X-ray Porosimetry Christopher L. Soles, Hae-Jeong Lee, Eric K. Lin, and Wen-li Wu
1,2,3-Triazole and its derivatives. Development of methods ...
www.mathnet.ru
Hernán R. Rengifo, Cristian Grigoras, Benjamin I. Dach, Xia Li, Nicholas J. Turro, Hae-Jeong Lee, Wen-Li Wu, Jeffrey T. Koberstein, “Solid Phase Synthesis of ...
Characterizing nanoimprint pattern cross-section and fidelity ...
proceedings.spiedigitallibrary.org
Hae-Jeong Lee ; Christopher L. Soles ; Hyun W. Ro ; D. R. Hines ; Ronald L. Jones ; Eric K. Lin ; Alamgir Karim ; Wen-li Wu. [+-] Author ...
REPORT DOCUMENTATION PAGE Form Approved
www.dtic.mil
Nicholas J. Turro, Hae-Jeong Lee, Wen-Li Wu, Jeffrey T. Koberstein Columbia University 615 West 131 Street Room 254, Mail Code New York, NY
Determining Coherence Length of X-ray Beam Using Line ...
ecst.ecsdl.org
Hae-Jeong Lee, Christopher L. Soles and Wen-li Wu. Polymers Division, National Institute of Standards and Technology, Gaithersburg, MD Specular ...
FPD China - 同期研讨会/活动 - CSTIC 会议日程
www.fpdchina.org
8:45-9:05. Determining Coherence Length of X-ray Beam Using Line Grating Structures. Hae-Jeong Lee, Christopher L. Soles, Wen-li Wu, NIST, USA. 9:05-9:25.
IMAPS Technical Program
www.imaps.org
Alamgir Karim, Hyun Wook Ro, Yifu Ding, Hae-Jeong Lee, Ronald L. Jones, Eric K. Lin, Christopher L. Soles, Wen-li Wu, NIST Polymers Division; Daniel R.
Program - Symposium L: Materials, Technology, and ...
www.mrs.org
Hae-Jeong Lee, Eric K. Lin, Howard Wang, Wen-li Wu, National Institute of Standards and Technology, Polymers Division, Gaithersburg, MD; ...
SEMICON China - SESSIONS / EVENTS - CSTIC
www.semiconchina.org
... for Characterizing Nano-patterns on Flat Substrate. Wen-li Wu, Chengqing Wang, Ronald L. Jones, Christopher Soles, Hae-Jeong Lee -NIST, USA ...
Dielectric Films for Advanced Microelectronics
lib.lhu.edu.vn
Christopher L. Soles, Hae-Jeong Lee, Bryan D. Vogt, Eric K. Lin, and Wen-li Wu Introduction Thin film density by X-ray reflectivity (XR)
Synchrotron X-Ray Reflectivity Studies of Nanoporous ...
www.lw20.com
... [5] Christopher L. SolesHae-Jeong LeeRonald C. HeddenDa-Wei Liu, ... Soles Hae-Jeong Lee Eric K. Lin Wen-Li Wu X-Ray Porosimetry Christo Pore ...
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