Molybdenum nano‐precipitates in silicon: A TEM and DLTS ...
onlinelibrary.wiley.com
by S Leonard · · Cited by 9 — George Rozgonyi,. George Rozgonyi. Materials Science, North Carolina State University, Suite 3070, Centennial EB-1, Raleigh, NC, ... › abs › pssb
Silicon Materials Science and Technology: Proceedings of the ...
books.google.com
... Toshiaki Ono and George Rozgonyi of NCSU for the TEM sample preparation and analysis , Darryl Cheek , Billy Nguyen and Gary Williamson's assistance in ...
Crystalline Defects and Contamination: Their Impact and Control in...
books.google.pt
... Silicon Depth Profiling by Infrared Spectroscopy, EBIC, and Preferential Etching Jinggang Lu and George Rozgonyi Materials Science and Engineering Dept, ...
Defects and Impurities in Silicon Materials: An Introduction to...
books.google.pt
... diodes, all of which are in everyday use today. Through his work, Prof. Rozgonyi was well known in the xi Personal Reminiscences About George Rozgonyi.
Effect of Metal Impurities in n-Type Silicon - North Carolina ...
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Mar 21, — Contributors : George Rozgonyi (PI). Project No: NCSU+. Yohan Yoon(PhD Candidate), NCSU. Prof. J. Park (Co-PI), Prof. › document › view › effect-of...
Research Article - Journal of Scientific and Engineering ...jsaer.com/download/vol-5-iss JSAER pdf
jsaer.com
Zbigniew Radzimski, Jeffrey Honeycutt and George A. Rozgonyi. Minority-carrier lifetime analysis of silicon epitaxy and bulk crystals with non uniformly ...
PDF (CERthesis.pdf)
thesis.library.caltech.edu
... substrates with coefficients of thermal expansion close to that of silicon. Thank you also to Magnus Wagener and George Rozgonyi at NCSU for the near-field.
(PDF) Poisson Ratio of Epitaxial Germanium Films Grown on
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Poisson Ratio of Epitaxial Germanium Films Grown on Silicon by Jayesh Bharathan, Jagdish Narayan, George Rozgonyi, Gary E. Bulman published in. › publication › poisson-ra...
All web results to the name "George A. Rozgonyi"
Poisson Ratio of Epitaxial Germanium Films Grown on Silicon
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by J Bharathan · · Cited by 8 — JAYESH BHARATHAN,1,2,3 JAGDISH NARAYAN,1 GEORGE ROZGONYI,1 and GARY E. BULMAN2. 1.Department of Materials Science and Engineering, North Carolina State ... › openview
Symposium A | MRS Fall Meeting | Boston
www.mrs.org
CHARGE-STATE DEFECT ENGINEERING OF SILICON DURING ION IMPLANTATION, Richard A. Brown, Chanrae Cho, Jallepally Ravi, George Rozgonyi, North Carolina State ... › fall1996 › symposium-a
余学功_编委信息-汉斯出版社(Hans Publishers)
hanspub.org
... Xiaoqiang Li, Xuegong Yu, Lihui Song, Deren Yang, and George Rozgonyi, Effect of nickel contamination on grain boundary states at a direct silicon ... › journal › Detail...
姜婷婷 - 研究生招生- 武汉科技大学
ysxy.wust.edu.cn
May 12, — (4)Tingting Jiang, Xuegong Yu, Xin Gu, George Rozgonyi, Deren Yang, Modulation of electrical characteristics at a Ni-contaminated silicon ... › page
논문 상세 - 한국학술지인용색인
www.kci.go.kr
박용국 /Yongkook Park 1 , Jinggang Lu 2 , George Rozgonyi 3. 1North Carolina State University. 2Glory Silicon Energy Corporation. › ciSereArtiView
Intragrain Defect Characterization Of Solar Grade Silicon Using...
repository.lib.ncsu.edu
Dr. George A. Rozgonyi, Committee Co-Chair Dr. Hans D. Hallen, Committee Co-Chair Dr. Gerd Duscher, Committee Member: Keywords: scanning probe microscopy …
NSF Award Search: Award # Operational Center for Silicon...
www.nsf.gov
George Rozgonyi, John Glasko, Sergei Koveshnikov, and A. Kvit. "Gettering and Defect Evolution from Vacancies to Nanovoids to Cavities and COPs in CZ ...
c- Si Metrology: Perspec;ves from Across the Supply Chain - PDF Free...
docplayer.net
... George A. Rozgonyi, Roger Clark: Casting Single Crystal Silicon: Novel Defect Profiles from BP Solar's Mono2 TM Wafers. Solid State Phenomena (2008)
Evaluating Amorphization Around Micro-Cracks in PV Silicon | MRS...
www.cambridge.org
Evaluating Amorphization Around Micro-Cracks in PV Silicon - Volume 1210
Journal of Electronic Materials | springerprofessional.de
www.springerprofessional.de
Poisson Ratio of Epitaxial Germanium Films Grown on Silicon. Jayesh Bharathan , Jagdish Narayan, George Rozgonyi, Gary E. Bulman | Issue
Molybdenum nano-precipitates in silicon: A TEM and DLTS study -...
www.research.manchester.ac.uk
author = "Simon Leonard and Markevich, {Vladimir P.} and Peaker, {Anthony R.} and Bruce Hamilton and Khaled Yousseff and George Rozgonyi",. note = "We ...
Papers and Patents – Dr. James A. Rand - Core Energy Workscoreenergyworks.com/papers-patents-dr-james-rand/
coreenergyworks.com
Jinggang Lu, George Rozgonyi, James Rand, Ralf Jonczyk , “Secondary phase inclusions in polycrystalline sheet silicon”, Journal of Crystal Growth, Volume ...
Operational Center for Silicon Wafer Engineering and Defect Science...
grantome.com
ABSTRACT EEC Rozgoni In order to be competitive in the integrated circuit industry, silicon chip manufacturers must continually strive to decrease the...
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