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News
Synopsys and Hitachi High-Technologies Deliver Enhanced ...
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... OPC modeling performance for our customers," said Aritoshi Sugimoto, general manager, Marketing & Planning Division, Semiconductor Equipment Business ...
Network Profiles
LinkedIn: Aritoshi Sugimoto - LinkedIn
Aritoshi Sugimotoさんのプロフィールをチェックしましょう。LinkedInは、Aritoshi Sugimotoさんのような方が活動する世界最大のプロフェッショナルネットワークです。今すぐ ...
Interests
Aritoshi SUGIMOTO - Patents
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Sorry, we were not able to pull up patent applications associated with Aritoshi SUGIMOTO. It's possible that Aritoshi SUGIMOTO's patent was not ...
Aritoshi Sugimoto, Inventor, Tokyo, JP
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Aritoshi Sugimoto's Inventor profile, Tokyo, JP, HITACHI, LTD.;, 62 patents/applications from Mar 04, to Aug 12, 2008, forward patent citations,...
Business Profiles
Researchgate: Aritoshi Sugimoto
Tokyo, Japan
patentbuddy: Aritoshi Sugimoto
HITACHI, LTD., Tokyo, JP
Books & Literature
Official Gazette of the United States Patent and Trademark ...
books.google.de
... Masahiro Watanabe, all of Yokohama,- Asahiro Kuni, Tokyo; Hiroyuki Shinada, C'hofu: Mar i Nozoe, Ome; Aritoshi Sugimoto, Tokyo, and Chie Shisbido.
Proceedings of the Joint Workshop of Fraunhofer IOSB ...
books.google.ca
Mari Nozoe, Aritoshi Sugimoto, and Takahide Ikeda. tion techniques for S01 wafers. Microlithography XII, Lars Rosenboom, Thomas Kreis, and Werner ...
Thirty-fourth International Symposium for Testing and Failure...
books.google.fr
[3] Joachim Loos, Jeroen K.J. van Duren, Francis Morrissey, Rene ́ A.J. Janssen, Polymer, 43 (2002), pp.7493–7496 [4] Aritoshi Sugimoto, Yukio Kembo, Kenji ...
USPTO Image File Wrapper Petition Decisions Google Books
books.google.de
... Yokohama, JAPAN; Masahiro Watanabe, Yokohama, JAPAN; Chie Shishido, Yokohama, JAPAN; Aritoshi Sugimoto, Tokyo, JAPAN; Maki Tanaka, Yokohama, ...
Related Documents
A new defectwww.siautomation.com › File › New_Defect_Distribution_Metrology
www.siautomation.com
Hisako Sato, Masami Ikota, Aritoshi Sugimoto, and Hiroo Masuda, Senior Member, IEEE. Abstract— We have proposed a novel discrete exponential distribution ...
researchr explore authors ARIT
researchr.org
... Aritoni · Aritoshi Kimura · Aritoshi Sugimoto · Aritoyo Kishimoto · Aritra Bandyopadhyay · Aritra Banerjee · Aritra Banik · Aritra Bej · Aritra Bhaduri · Aritra Biswas ...
Inventor list - AMiner
aminer.org
... Nozoe Haruo Yoda Kimiaki Ando Katsuhiro Kuroda Aritoshi Sugimoto Katsuya Sugiyama Atsuko Takafuji Yusuke Yajima Hiroshi Tooyama Tadao Ino Kazushi ...
Scientific Publications
dblp: Aritoshi Sugimoto
dblp1.uni-trier.de
List of computer science publications by Aritoshi Sugimoto
DBLP -
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Cloud Mining - DBLP DBLP. Searching for: Aritoshi Sugimoto. Oops we found no results for your query. Try to type some keywords or refine by the facets on your ...
Publications
Metrology, Inspection, and Process Control for Microlithography XIX |...
spie.org
Proceedings of SPIE Volume Metrology, Inspection, and Process ... Hideo Todokoro; Tadashi Otaka; Aritoshi Sugimoto . Show Abstract. Optical
Airiti Library華藝線上圖書館_半導體製程之缺陷分析與改善www.airitilibrary.com › Publication › alDetailedMesh
www.airitilibrary.com
連結：; [8] Hiroshi Nagaishi, and Munetoshi Fukui, and Hisao Asakura, and Aritoshi Sugimoto , "Defect Reduction in Cu Dual Damascene Process Using ...
Miscellaneous
Aritoshi Sugimoto | LinkedIn
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View Aritoshi Sugimoto's professional profile on LinkedIn. LinkedIn is the world's largest business network, helping professionals like Aritoshi Sugimoto discover
EP A4 - Apparatus for detecting defect in device and method of...
patents.google.com
Other languages: German: English: French; Inventor: Tohru Ishitani: Hidemi Koike: Aritoshi Sugimoto: Isamu Sekihara: Kaoru Umemura: Satoshi Tomimatsu ...
EP A4 - Appareil de detection de defauts dans un dispositif et...
patents.google.com
Inventeurs, Tohru Ishitani, Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu, Junzo Azuma. Déposant, Hitachi Ltd, Hitachi ...
US B2 - Method and apparatus for inspecting integrated circuit...
patents.google.com
To make possible the in-line inspection of a pattern of an insulating material A patterned wafer formed with a pattern by a resist film is...
Advanced surface inspection techniques for SOI wafers
www.spiedigitallibrary.org
SPIE Digital Library Proceedings
CiteSeerX — Kenji Watanabe, Dr. Eng.
citeseerx.ist.psu.edu
by Aritoshi Sugimoto , Mari Nozoe ... {Aritoshi Sugimoto and Mari Nozoe}, title = {Kenji Watanabe, Dr. Eng.}, year = {}} Share. OpenURL .
WO A1 - Method of manufacturing semiconductor integrated...
patents.google.com
A method of manufacturing a semiconductor integrated circuit device, in which pattern on photomasks are transferred to a semiconductor wafer, and...
EP A1 - Probe apparatus - Google Patentswww.google.com.mt › patents
patents.google.com
Other languages: German: French; Inventor: Satoshi Tomimatsu: Hidemi Koike: Junzo Azuma: Tohru Ishitani: Aritoshi Sugimoto: Yuichi Hamamura: Isamu ...
WO A1 - Procede et appareil de guidage de sonde
patents.google.com
Inventeurs, Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura, Isamu Sekihara, Akira Shimase. Déposant ...
Evolution and Future of Critical Dimension...
www.hitachi.com
Evolution and Future of Critical Dimension Measurement System for Semiconductor Processes ... Aritoshi Sugimoto Joined Hitachi, Ltd. in 1979, and now works at the
High-energy scanning electron microscope for the observation of...
www.spiedigitallibrary.org
SPIE Digital Library Journals
US B2 - Method of inspecting a pattern on a substrate...
patents.google.com
A method for inspecting a pattern formed on a substrate, includes the steps of moving a table along a first direction on which a substrate to be...
US A1 - Probe driving method, and probe apparatus...
patents.google.com
Cessionnaire d'origine, Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura, Isamu Sekihara, Akira Shimase.
Evolution and Future of Critical Dimension Measurement System for...
technodocbox.com
Aritoshi Sugimoto Joined Hitachi, Ltd. in 1979, and now works at the Strategic Business Planning Division, Electronic Device Systems Business Group, Hitachi ...
Executive Summary - Semiconductor Industry Association
www.semiconductors.org
Jyu-Horng Shieh, Chin Soobok, Rien Stoup, Aritoshi Sugimoto, Vladimir Ukraintsev, Brad van Eck, Mauro Vasconi,. Dick T.A.P. Verkleij, Andras Vladar, Dan ...
EP A APPARATUS FOR TRACKING ERRORS IN AN ARRANGEMENT AND...
patents.google.com
Nhà sáng chế, Tohru Ishitani, Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu, Junzo Azuma. Người nộp đơn, Hitachi Ltd ...
US B2 - Method and system for inspecting a pattern ...www.google.com › patents
patents.google.com
Inventor: Takashi Hiroi: Maki Tanaka: Masahiro Watanabe: Asahiro Kuni: Hiroyuki Shinada: Mari Nozoe: Aritoshi Sugimoto: Chie Shishido; Current Assignee.
US B2 - Method and apparatus for inspecting ...
patents.google.com
... Yutaka Kaneko: Maki Tanaka: Shunji Maeda: Hitoshi Kubota: Aritoshi Sugimoto: Katsuya Sugiyama: Atsuko Takafuji: Yusuke Yajima: Hiroshi Tooyama: Tadao ...
In-line e-beam inspection with optimized sampling and newly ...
www.spiedigitallibrary.org
Masami Ikota, Akihiro Miura, Munenori Fukunishi, Takashi Hiroi, and Aritoshi Sugimoto "In-line e-beam inspection with optimized sampling and newly developed ...
KAWARADA Lab. PEOPLE
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DOCTOR COURSE. BI Te; Aritoshi Sugimoto. RESEARCHER. Yukihiro Shintani; Mohd Syamsul Nasyriq Bin Samsol Baharin; Mohd Sukri Shaili Falina Binti.
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