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Andrei Veldman, 55, Sunnyvale, Texas Oak Ter
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Srihari R Hosahalli from Sunnyvale, CA - Found 6 Phones (+ ...
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Andrei Veldman Age 59. (408) · 487 Texas Oak Ter Sunnyvale, CA · Anna E Varzar Age 49. (408) · 487 Texas Oak Ter Sunnyvale, ...
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Andrei V. Shchegrov - Patent Inventor
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List of recent Andrei V. Shchegrov patent applications
Kevin Peterlinz - Patent Inventor
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Business Profiles
patentbuddy: Andrei Veldman
TOKYO ELECTRON LIMITED, Santa Clara, CA, US
Private Homepages
Contact hole characterization by SEM waveform analysis
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SPIE Digital Library Proceedings
Books & Literature
Official Gazette of the United States Patent and Trademark Office:...
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... and Andrei Veldman, Jerusalem, both of Israel, assignors to Applied Materials, Inc., Santa Clara. Calif. Filed Nov. 17, 1998, Appl. No. 193,720 Int Cl. COIN ...
Related Documents
METHODS AND APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE OVERLAY...
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Apr 30, · ... application claims the benefit of prior application U.S. Provisional Application No ,230, filed 28 Oct by Andrei Veldman et al., ...
Method for optimizing the configuration of a scatterometry...
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The present application discloses a method of model-based measurement of semiconductor device features using a scatterometer system. The method includes at...
Miscellaneous
Andrei Veldman | LinkedIn
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EP A4 - Optical metrology tool equipped with modulated...
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Andrei Veldman Kevin Peterlinz Gregory Brady Derrick Shaughnessy Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) KLA Tencor Corp Original Assignee KLA Tencor Corp
US B1 - Method for optimizing the configuration of a...
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The present application discloses a method of model-based measurement of semiconductor device features using a scatterometer system. The method includes...
US A1 - Full Beam Metrology For X-Ray Scatterometry Systems...
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Methods and systems for characterizing dimensions and material properties of semiconductor devices by full beam x-ray scatterometry are described herein....
METHODS AND APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE OVERLAY...
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Patent application title: METHODS AND APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE OVERLAY USING X-RAY METROLOGY Inventors: Andrei Veldman …
US B1 - Model-based metrology using tesselation-based...
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A novel technique for model-based metrology. A geometry of structure to be measured on a surface of a substrate is received. A tessellation of the...
ClaimParse | Patent
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Patent No. 9,255,877. Issue Date, February 09, Title, Metrology System Optimization For Parameter Tracking. Inventorship, Andrei Veldman, Sunnyvale, CA (US) Andrei V. Shchegrov, Campbell, CA (US) Gregory Brady, San Jose, CA (US) Thaddeus Gerard Dziura, San Jose, CA (US) Stilian Ivanov Pandev, Santa ...
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