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Mentor looks at dual approach to chip test | SMART Group
www.smartgroup.org
... most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer Guettaf ...
Mentor looks at dual approach to chip test
www.electronicsweekly.com
Amer Guettaf ... For testing complex chip designs it makes sense to combine the two most common
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