Transmission electron microscopy in micro-nanoelectronics [electronic...
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Transmission electron microscopy in micro-nanoelectronics [electronic resource] / edited by Alain Claverie. Format: Book; Language: English; Published/Created: [London: ISTE, 2013]; Description: xiii, 243 p. : ill. Series: Nanoscience and nanotechnology series; Bibliographic references: Includes bibliographical ...
Alain Claverie: Transmission Electron Microscopy in Micro-nanoelectronics (ebook/PC-PDF)
2013, Sciences, Engineering / Technics, Electronics, Electrical Engineer, ISBN:
Alain Claverie: Transmission Electron Microscopy in Micro-nanoelectronics (ebook/EPUB)
2013, Sciences, Engineering / Technics, Electronics, Electrical Engineer, ISBN:
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Alain Claverie. ISBN: pages. December 2012, Wiley-ISTE. Transmission Electron Microscopy in Micro-nanoelectronics ( ) ...
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Auteur: Alain Claverie Alain Claverie. Uitgever: Iste Ltd And John Wiley &Amp; Sons Inc. Engels; ; december 2012; Hardcover; 258 pagina's.
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Alain Claverie (2015) : "Silicon Front-End Junction Formation", "Transmission Electron Microscopy in Micro-nanoelectronics", "Sams Bil", "Guide to the ...
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Transmission Electron Microscopy in Micro-Nanoelectronics (Hardback). Alain Claverie. 0 valoraciones por Goodreads. ISBN 10: ISBN 13: Editorial: ISTE Ltd and John Wiley Sons Inc, United Kingdom, Nuevos Condición: New Encuadernación de tapa dura. Guardar para más tarde.
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By Alain Claverie. Today, the supply of vivid and hugely coherent electron resources and delicate detectors has extensively replaced the kind and caliber of the data which are got by means of transmission electron microscopy (TEM). TEMs at the moment are found in huge numbers not just in academia, but ...
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Transmission Electron Microscopy in Micro-nanoelectronics. Transmission Electron Microscopy in Micro-nanoelectronics. Edited by. Alain Claverie, CEMES ...
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Title, Transmission electron microscopy in micro-nanoelectronics / edited by Alain Claverie. Published, Hoboken, N.J. : John Wiley andSons, Incorporated,
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